Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential Circuits Using a Time Expansion Model.
Toshinori HosokawaToshihiro HiraokaTomoo InoueHideo FujiwaraPublished in: Asian Test Symposium (1999)
Keyphrases
- formal model
- computational model
- objective function
- qualitative and quantitative
- linear regression
- input data
- mathematical model
- conceptual model
- experimental data
- learning models
- statistical methods
- probability distribution
- computational cost
- high level
- statistical models
- machine learning methods
- classification method
- statistical model
- prior knowledge
- optimal solution
- hybrid method
- learned models