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Efficient Parallel Feature Selection for Steganography Problems.

Alberto GuillénAntti SorjamaaYoan MicheAmaury LendasseIgnacio Rojas
Published in: IWANN (1) (2009)
Keyphrases
  • feature selection
  • high dimensionality
  • efficient solutions
  • machine learning
  • data mining
  • dimensionality reduction
  • feature selection algorithms
  • satisfiability testing