Pattern classification using principal components of cortical thickness and its discriminative pattern in schizophrenia.
Uicheul YoonJong-Min LeeKiho ImYong-Wook ShinBaek Hwan ChoIn-Young KimJun Soo KwonSun I. KimPublished in: NeuroImage (2007)
Keyphrases
- pattern classification
- principal components
- cortical thickness
- feature extraction
- principal component analysis
- partial volume
- parzen window
- dimensionality reduction
- pattern recognition
- functional magnetic resonance imaging
- feature set
- covariance matrix
- feature selection
- cerebral cortex
- quantitative analysis
- white matter
- medical images
- magnetic resonance images
- neural network
- discriminant analysis
- linear discriminant analysis
- image classification
- learning theory
- maximum margin
- semi supervised
- image analysis
- feature space