Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-Simulation.
Dongzhe YuHan WangJiangtao XuPublished in: J. Electron. Test. (2020)
Keyphrases
- worst case
- high frequency
- power consumption
- user interface
- simulation model
- radio frequency
- signal processing
- average case
- greedy algorithm
- user friendly
- duty cycle
- simulation models
- mathematical model
- np hard
- lower bound
- human computer interaction
- compressive sensing
- special case
- direct manipulation
- signal detection
- computational complexity