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Barrier height inhomogeneities in a Ni/SiC-6H Schottky n-type diode.

H. BenmazaB. AkkalHamza AbidJean-Marie BluetMacho AnaniZ. Bensaad
Published in: Microelectron. J. (2008)
Keyphrases
  • multiscale
  • high density
  • data sets
  • machine learning
  • image processing
  • multi agent
  • special case
  • computer simulation
  • design methodology