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Thin Film Magnetic Head Wafer Inspection Technique Using Geometrical Feature Based Image Comparison.
Atsushi Shimoda
Hisafumi Iwata
Yukihiro Shibata
Hidehiro Ikeda
Published in:
MVA (1998)
Keyphrases
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thin film
image features
image data
input image
single image
image retrieval
neural network
image segmentation
high resolution
integrated circuit
film thickness
edge detection
multi layer