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Accelerated life test of high power white light emitting diodes based on package failure mechanisms.

S. I. ChanW. S. HongK. T. KimY. G. YoonJ. H. HanJoong Soon Jang
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • high power
  • light emitting diodes
  • low power
  • high density
  • power supply
  • video sequences
  • high speed