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Effect of lateral straggle parameter on Hetero Junction Dual Gate Vertical TFET.

Karthik NasaniBrinda BhowmickPuspa Devi Pukhrambam
Published in: Microelectron. J. (2023)
Keyphrases
  • data structure
  • low cost
  • maximum likelihood
  • input parameters
  • machine learning
  • database systems
  • multiresolution
  • particle swarm optimization
  • associative memory
  • parameter tuning
  • leakage current