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An Accurate Device-Level Simulation Method to Estimate Cross Sections of Single Event Upsets by Silicon Thickness in Raised Layer.

Kentaro KojimaKodai YamadaJun FurutaKazutoshi Kobayashi
Published in: IRPS (2019)
Keyphrases
  • cross section
  • cross sections
  • synthetic data
  • fully automatic
  • similarity measure
  • x ray
  • computer vision