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Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Process.

Corrado De SioSarah AzimiLuca SterponeDavid Merodio Codinachs
Published in: DFT (2022)
Keyphrases
  • low cost
  • process model
  • statistical analysis
  • memory usage
  • database
  • data mining
  • event detection
  • embedded systems
  • events occurring