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Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Process.
Corrado De Sio
Sarah Azimi
Luca Sterpone
David Merodio Codinachs
Published in:
DFT (2022)
Keyphrases
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low cost
process model
statistical analysis
memory usage
database
data mining
event detection
embedded systems
events occurring