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Fast and Reliable STT-MRAM Using Nonuniform and Adaptive Error Detecting and Correcting Scheme.
Nour Sayed
Rajendra Bishnoi
Mehdi Baradaran Tahoori
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2019)
Keyphrases
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design considerations
error rate
multiresolution
classification scheme
database
neural network
cost effective
prediction error
error analysis
detection scheme
error accumulation