Identifying systematic spatial failure patterns through wafer clustering.
Mohamed Baker AlawiehFa WangXin LiPublished in: ISCAS (2016)
Keyphrases
- spatial patterns
- clustering algorithm
- spatial data
- similar patterns
- pattern extraction
- k means
- spatial information
- spatial clustering
- spatio temporal patterns
- spatio temporal
- clustering method
- spatial and temporal
- cluster analysis
- data clustering
- spatial features
- neighborhood information
- multiple data streams
- outlier detection
- unsupervised learning
- root cause
- interesting patterns
- categorical data
- self organizing maps
- spatio temporal data
- spatial reasoning
- pattern discovery
- semiconductor manufacturing
- hierarchical clustering
- spectral clustering
- document clustering
- spatial data mining
- website
- grid cells
- multivariate time series
- integrated circuit
- spatial databases
- design patterns
- pattern mining
- frequent patterns
- space time
- high dimensional data
- data mining techniques