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Wafer Testing with Pairwise Comparisons.

Kaiyuan HuangVinod K. AgarwalLaurence E. LaForge
Published in: FTCS (1992)
Keyphrases
  • pairwise comparisons
  • pairwise comparison
  • preference learning
  • pairwise
  • preference relations
  • artificial intelligence
  • feature selection
  • training set
  • probability distribution
  • voting scheme