Optimizing the Cost of Test at Intel Using per Device Data.
Robert EdmondsonGregory IovinoRichard KacprowiczPublished in: ITC (2006)
Keyphrases
- data sets
- data sources
- data collection
- storage space
- synthetic data
- data processing
- input data
- database
- image data
- prior knowledge
- high quality
- complex data
- data objects
- data structure
- training data
- original data
- website
- search engine
- noisy data
- raw data
- data mining techniques
- statistical methods
- data acquisition
- test data
- data distribution
- high dimensional data
- small number
- data analysis
- database systems
- databases
- real time