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Research on a Security Chip Power-Down Test Method Based on MP300 Device.
Qingqin Fu
Jun Liu
Rui Nie
Zhengquan Ang
Jia Liu
Zheng Li
Ling Yi
Pingjiang Xu
Yujie Shi
Zhaoqing Liang
Jiahui Yuan
Published in:
FSDM (2019)
Keyphrases
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cost function
detection method
test data
computational cost
high accuracy
synthetic data
segmentation method
high precision
neural network
feature selection
computational complexity
experimental evaluation
low cost
classification method