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Modulation, Losses, and Semiconductor Requirements of Modular Multilevel Converters.
Steffen Rohner
Steffen Bernet
Marc Hiller
Rainer Sommer
Published in:
IEEE Trans. Ind. Electron. (2010)
Keyphrases
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machine learning
real world
data mining
information systems
expert systems
artificial neural networks
computer simulation
functional requirements
semiconductor manufacturing
amplitude modulation
modular neural networks
plasma etching