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Power Semiconductor Devices and Packages: Solder Mechanical Characterization and Lifetime Prediction.

Michele CalabrettaAlessandro SittaSalvatore Massimo OliveriGaetano Sequenzia
Published in: IEEE Access (2021)
Keyphrases
  • semiconductor devices
  • electron beam
  • prediction accuracy
  • power consumption
  • load forecasting
  • mechanical properties
  • prediction error
  • prediction algorithm
  • prediction model
  • field effect transistors
  • electrical power