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Extraction and Analysis of Spatial Correlation Micrograph Features for Traceability in Manufacturing.

Adam DachowiczMikhail J. AtallahJitesh H. Panchal
Published in: J. Comput. Inf. Sci. Eng. (2020)
Keyphrases
  • spatial correlation
  • low level
  • co occurrence
  • statistical analysis
  • object recognition
  • feature vectors
  • classification accuracy
  • image features
  • feature analysis
  • information extraction
  • quality control