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Extraction and Analysis of Spatial Correlation Micrograph Features for Traceability in Manufacturing.
Adam Dachowicz
Mikhail J. Atallah
Jitesh H. Panchal
Published in:
J. Comput. Inf. Sci. Eng. (2020)
Keyphrases
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spatial correlation
low level
co occurrence
statistical analysis
object recognition
feature vectors
classification accuracy
image features
feature analysis
information extraction
quality control