An antagonistic training algorithm for TFT-LCD module mura defect detection.
Guimin LinLingfeng KongTianjian LiuLida QiuXiyao ChenPublished in: Signal Process. Image Commun. (2022)
Keyphrases
- training algorithm
- defect detection
- liquid crystal displays
- tft lcd
- thin film transistor
- back propagation
- neural network
- training process
- image formation
- feature extraction
- thin film
- learning algorithm
- high resolution
- rbf neural network
- motion blur
- learning rate
- support vector machine
- eye tracking
- higher resolution
- feed forward
- goal programming
- display devices
- hidden layer
- fuzzy logic
- stock price
- artificial neural networks
- supply chain
- expert systems
- pattern recognition
- decision making
- computer vision