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Cost-Effective Test Screening Method on 40-nm Embedded SRAMs for Low-Power MCUs.
Yoshisato Yokoyama
Yuichiro Ishii
Koji Nii
Kazutoshi Kobayashi
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2021)
Keyphrases
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cost effective
low power
low cost
high speed
real time
computational complexity
infrared
message passing
vlsi circuits