Performance characterization of a microwave transistor subject to the noise and matching requirements.
Filiz GünesSalih DemirelPublished in: Int. J. Circuit Theory Appl. (2016)
Keyphrases
- high speed
- image matching
- noisy data
- noise level
- signal to noise ratio
- matching algorithm
- matching process
- integrated circuit
- feature points
- application specific
- graph matching
- noisy environments
- arbitrary shape
- requirements engineering
- frequency band
- matching scheme
- image set
- feature matching
- real time
- pattern matching
- input data
- low cost
- software engineering
- computer vision