A BIST methodology for at-speed testing of data communications transceivers.
S. L. LinS. MouradS. KrishnanPublished in: Asian Test Symposium (2000)
Keyphrases
- data sets
- data collection
- database
- data analysis
- image data
- original data
- training data
- computer systems
- high speed
- test data
- statistical analysis
- data sources
- data structure
- raw data
- data objects
- statistical methods
- multimedia data
- network structure
- data quality
- data distribution
- missing data
- high dimensional data
- high quality
- website
- learning algorithm
- real time