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A Method for the Automatic Selection of Test Frequencies in Analog Fault Diagnosis.
Francesco Grasso
Antonio Luchetta
Stefano Manetti
Maria Cristina Piccirilli
Published in:
IEEE Trans. Instrum. Meas. (2007)
Keyphrases
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fault diagnosis
bp neural network
automatic selection
multi sensor information fusion
artificial intelligence
neural network
feature extraction
clustering method
mathematical model
expert systems
wavelet transform
information fusion
rbf neural network
analog circuits