13.8 A 32kb SRAM for error-free and error-tolerant applications with dynamic energy-quality management in 28nm CMOS.
Fabio FrustaciMahmood KhayatzadehDavid T. BlaauwDennis SylvesterMassimo AliotoPublished in: ISSCC (2014)
Keyphrases
- error free
- error tolerant
- quality management
- power consumption
- low power
- graph matching
- cmos technology
- quality assessment
- fuzzy theory
- data quality
- random access memory
- high speed
- error prone
- project management
- low voltage
- neural network
- similarity measure
- information systems
- water quality
- quality control
- data analysis
- pattern recognition
- e learning