Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference.
Wangyang ZhangXin LiRob A. RutenbarPublished in: DAC (2010)
Keyphrases
- bayesian inference
- probabilistic model
- statistical inference
- variational inference
- prior distribution
- prior information
- bayesian model
- variational bayes
- hyperparameters
- particle filter
- virtual environment
- hierarchical bayesian
- hidden variables
- markov networks
- weighted model counting
- expectation propagation
- data sets
- gibbs sampler
- posterior distribution
- probabilistic modeling