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FRoC 2.0: Automatic BRAM and Logic Testing to Enable Dynamic Voltage Scaling for FPGA Applications.

Ibrahim AhmedShuze ZhaoJames MeijersOlivier TrescasesVaughn Betz
Published in: ACM Trans. Reconfigurable Technol. Syst. (2019)
Keyphrases
  • receiver operating characteristic
  • fully automatic
  • digitized mammograms
  • test cases
  • semi automatic
  • hardware implementation