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FRoC 2.0: Automatic BRAM and Logic Testing to Enable Dynamic Voltage Scaling for FPGA Applications.
Ibrahim Ahmed
Shuze Zhao
James Meijers
Olivier Trescases
Vaughn Betz
Published in:
ACM Trans. Reconfigurable Technol. Syst. (2019)
Keyphrases
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receiver operating characteristic
fully automatic
digitized mammograms
test cases
semi automatic
hardware implementation