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DRAM Yield Analysis and Optimization by a Statistical Design Approach.

Yan LiHelmut SchneiderFlorian SchnabelRoland ThewesDoris Schmitt-Landsiedel
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2011)
Keyphrases
  • statistical analysis
  • case study
  • optimization algorithm
  • design process
  • data sets
  • high speed
  • multi dimensional
  • optimization problems
  • data driven
  • optimization process
  • optimal design