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DRAM Yield Analysis and Optimization by a Statistical Design Approach.
Yan Li
Helmut Schneider
Florian Schnabel
Roland Thewes
Doris Schmitt-Landsiedel
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2011)
Keyphrases
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statistical analysis
case study
optimization algorithm
design process
data sets
high speed
multi dimensional
optimization problems
data driven
optimization process
optimal design