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Reliability analysis for flexible electronics: Case study of integrated a-Si: H TFT scan driver.

Tsung-Ching HuangKwang-Ting (Tim) ChengHuai-Yuan TsengChen-Pang Kung
Published in: ACM J. Emerg. Technol. Comput. Syst. (2008)
Keyphrases
  • reliability analysis
  • case study
  • real world
  • design process
  • databases
  • case based reasoning
  • software development
  • genetic programming
  • fault tree