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Existence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened Latches for Sub-65nm CMOS Technologies.
Sam M.-H. Hsiao
Lowry P.-T. Wang
Aaron C.-W. Liang
Charles H.-P. Wen
Published in:
ITC (2022)
Keyphrases
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low power
x ray
cmos technology
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infrared
event detection
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circuit design