Login / Signup

Supervised segmentation of microelectrode recording artifacts using power spectral density.

Eduard BaksteinJakub SchneiderTomás SiegerDaniel NovákJirí WildRobert Jech
Published in: EMBC (2015)
Keyphrases
  • power spectral density
  • spectral analysis
  • image segmentation
  • fourier transform
  • learning algorithm
  • high quality
  • multiscale
  • region growing
  • prediction error
  • edge detection
  • power spectrum
  • blind separation