A low-noise latching comparator probe for waveform sampling applications.
David I. BergmanBryan C. WaltripPublished in: IEEE Trans. Instrum. Meas. (2003)
Keyphrases
- low signal to noise ratio
- random noise
- noise level
- monte carlo
- noisy data
- row column
- high noise
- image noise
- random sampling
- missing data
- sample size
- signal noise ratio
- sampled data
- noise model
- additive noise
- noise sensitivity
- signal to noise ratio
- frequency domain
- input data
- multiscale
- low pass filtering
- band limited
- median filter
- power spectrum
- high levels
- image sequences
- low frequency
- noisy images
- face recognition