Nanoscale imaging by using label free microscopy techniques.
George A. StanciuDenis E. TrancaStefan G. StanciuCatalin StoichitaRadu HristuPublished in: ICTON (2017)
Keyphrases
- atomic force microscopy
- image analysis
- high resolution
- fluorescence microscopy
- phase contrast images
- imaging systems
- medical imaging
- synthetic aperture
- image labeling
- high throughput
- image processing
- multi label
- pattern recognition
- neural network
- class labels
- computer vision
- magnetic resonance images
- microarray
- clinical applications
- image segmentation