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Circumferential Local Ternary Pattern: New and Efficient Feature Descriptors for Anti-Counterfeiting Pattern Identification.

Zhaohui ZhengBichao XuJianping JuZhongyuan GuoChanghui YouQiang LeiQiang Zhang
Published in: IEEE Trans. Inf. Forensics Secur. (2022)
Keyphrases
  • feature descriptors
  • high quality
  • image features
  • higher order