An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices.
Renan Trevisoli DoriaJoão Antonio MartinoEddy SimoenCor ClaeysMarcelo Antonio PavanelloPublished in: Microelectron. Reliab. (2012)
Keyphrases
- experimental evaluation
- significant improvement
- preprocessing
- cost function
- pairwise
- computational cost
- high precision
- synthetic data
- detection method
- optimization algorithm
- main contribution
- computationally efficient
- classification accuracy
- prior knowledge
- objective function
- multiscale
- model selection
- color images
- theoretical analysis
- computational complexity
- matching algorithm
- data sets