Automated optical inspection for abnormal-shaped packages.

Wei-Yu Lin Chen-Tao Hsu Chi-Chun Chang Jen-Hui Chuang

Published in: IRIACV (2019)

Keyphrases

anomaly detection
fully automated
semi automated
database
abnormal patterns
printed circuit boards
font recognition
neural network
learning algorithm
artificial intelligence
computer vision
bayesian networks
quality of service
semi automatic
context sensitive
visual inspection