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An Accurate Probabilistic Reliability Model for Silicon PUFs.
Roel Maes
Published in:
IACR Cryptol. ePrint Arch. (2013)
Keyphrases
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probabilistic model
computational model
statistical model
mathematical model
experimental data
neural network model
real time
markov random field
theoretical analysis
petri net
bayesian framework
posterior probability
prediction model
accurate models
reliability analysis