A low-cost built-in self-test for CP-PLL based on TDC.

Lanhua Xia Jianhui Wu Zhikuang Cai Meng Zhang Xincun Ji

Published in: IEICE Electron. Express (2014)

Keyphrases

low cost
built in self test
constraint programming
low power
integrated circuit
cost effective
digital camera
neural network
real time
decision making
data sets
data acquisition
highly efficient
image sequences
data structure
preprocessing
expert systems
special case