Investigation of Safe Operating Area on 4H-SiC 600V VDMOSFET with TLP and UIS Test Methods.
Chao-Yang KeYu-Chia TsuiBing-Yue TsuiMing-Dou KerPublished in: IRPS (2023)
Keyphrases
- neural network
- benchmark datasets
- artificial intelligence
- preprocessing
- computational cost
- information retrieval
- computationally expensive
- significant improvement
- statistical significance
- database
- experimental design
- machine learning methods
- model selection
- image retrieval
- expert systems
- image processing
- machine learning