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Multi-PVT-Point Analysis and Comparison of Recent Small-Delay Defect Quality Metrics.
Omar Al-Terkawi Hasib
Yvon Savaria
Claude Thibeault
Published in:
J. Electron. Test. (2019)
Keyphrases
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quality metrics
data analysis
databases
computer vision
metadata
high quality
multiresolution
image classification
natural images
quality evaluation