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S-TAT Leakage Current in Partial Isolation Type Saddle-FinFET (Pi-FinFET)s.
Jin Hyo Park
Geon Kim
Dong Yeong Kim
Su Yeon Kim
Sunyong Yoo
Myoung Jin Lee
Published in:
IEEE Access (2021)
Keyphrases
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leakage current
learning environment
wireless sensor networks
response time
low cost