Login / Signup

S-TAT Leakage Current in Partial Isolation Type Saddle-FinFET (Pi-FinFET)s.

Jin Hyo ParkGeon KimDong Yeong KimSu Yeon KimSunyong YooMyoung Jin Lee
Published in: IEEE Access (2021)
Keyphrases
  • leakage current
  • learning environment
  • wireless sensor networks
  • response time
  • low cost