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Fast and accurate emissivity and absolute temperature maps measurement for integrated circuits.
Hsueh-Ling Yu
Yih-Lang Li
Tzu-Yi Liao
Tianchen Wang
Yiyu Shi
Shu-Fei Tsai
Published in:
ICCAD (2014)
Keyphrases
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integrated circuit
surface temperature
absolute position
high accuracy
high quality
computationally efficient
infrared
data mining
highly accurate
printed circuit boards
measurement model
information retrieval
information systems
finite element