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Virtual Shifting Impedance Method for Extended Range High-Fidelity PHIL Testing.

Alexandros G. PaspatisAlkistis KontouZhiwang FengMazheruddin H. SyedGeorg LaussGraeme BurtPanos KotsampopoulosNikos D. Hatziargyriou
Published in: IEEE Trans. Ind. Electron. (2024)
Keyphrases
  • high fidelity
  • similarity measure
  • high quality
  • active learning
  • significant improvement
  • image data
  • decision makers
  • test data