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Joint impact of random variations and RTN on dynamic writeability in 28nm bulk and FDSOI SRAM.

Brian ZimmerOlivier ThomasSeng Oon TohTaylor VincentKrste AsanovicBorivoje Nikolic
Published in: ESSDERC (2014)
Keyphrases
  • dynamic environments
  • data sets
  • databases
  • website
  • case study
  • hidden markov models
  • high speed
  • power consumption
  • randomly generated
  • dynamically changing