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Design on ESD robustness of source-side discrete distribution in the 60-V high-voltage nLDMOS devices.

Shen-Li ChenChih-Hung YangChih-Ying YenKuei-Jyun ChenYi-Cih WuJia-Ming Lin
Published in: ICCE-TW (2016)
Keyphrases
  • high voltage
  • real time
  • computational intelligence
  • embedded systems
  • machine learning
  • reinforcement learning
  • probability distribution
  • small number
  • design process