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Practical Considerations in RLCK Crosstalk Analysis for Digital Integrated Circuits.

Steven C. ChanKenneth L. Shepard
Published in: ICCAD (2001)
Keyphrases
  • integrated circuit
  • image analysis
  • neural network
  • expert systems
  • artificial intelligence
  • statistical analysis
  • database
  • machine learning
  • three dimensional
  • image sequences
  • signal processing
  • visual inspection