Semi-empirical RF MOST model for CMOS 65 nm technologies: Theory, extraction method and validation.
Rafaella FiorelliEduardo J. PeralíasPublished in: Integr. (2016)
Keyphrases
- theoretical framework
- computational model
- mathematical model
- formal model
- theoretical foundation
- theoretical analysis
- data mining
- objective function
- high level
- management system
- high speed
- cost function
- parameter estimation
- knowledge base
- statistical model
- experimental data
- neural network model
- learning algorithm
- computational models
- simulation model
- data sets
- empirical data