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Industrial BIST of Embedded RAMs.

Paolo CamuratiPaolo PrinettoMatteo Sonza ReordaStefano BarbagalloAndrea BurriDavide Medina
Published in: IEEE Des. Test Comput. (1995)
Keyphrases
  • industrial applications
  • video sequences
  • embedded systems
  • artificial intelligence
  • reinforcement learning
  • search algorithm
  • digital libraries
  • evolutionary algorithm
  • multiresolution
  • mathematical analysis