Novel IEEE-STD-1241-Based Test Methods for Analog-to-Information Converter.
Veronica M. L. SilvaCleonilson Protásio de SouzaRaimundo C. S. FreireBruno Willian de Souza ArrudaEdmar C. GurjaoVanderson L. ReisPublished in: IEEE Trans. Instrum. Meas. (2020)