Parallel Testing Method by Partitioning Circuit Based on the Exhaustive Test.
Wu Woan KimPublished in: ICCSA (2) (2004)
Keyphrases
- test data
- significant improvement
- high accuracy
- detection method
- high precision
- error rate
- computational complexity
- optimization method
- optimization algorithm
- data sets
- dynamic programming
- support vector machine svm
- parallel processing
- fully automatic
- mathematical model
- synthetic data
- segmentation algorithm
- support vector machine
- classification accuracy
- experimental evaluation
- feature vectors
- preprocessing
- similarity measure