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Piezoresistor defect classification using convolutional neural networks based on incremental branch growth.
Lin Huang
Yi-gong Zhao
Tiejun Yang
Published in:
Multim. Tools Appl. (2022)
Keyphrases
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convolutional neural networks
defect classification
convolutional network
databases
incremental clustering
facial landmark localization
data sets
incremental learning
neural network
machine learning
artificial intelligence
semi supervised